Cantilever Probe Card

Cantilever

Cantilever products support wafer test for fine pitch, wire bonded logic devices. Built on over 30 years experience, MicroProbe offers unmatched product quality and impressive capability including complex designs such as quad-site shelf and short-beam.

Cantilever features include:

• Supports 40um pitch, 20/40um staggered design
• Short-beam option for high speed testing, up to 3GHz @-3dB
• Uniform scrub performance for improved wire bond reliability