PRODUCT SPOTLIGHT MicroProbe Mx-FinePitch for Mobile Consumer Devices & Technologies

The direct-dock probe card enables final test at wafer sort by removing the bandwidth limitation between the tester and the semiconductor device under test. By leveraging system-level optimization, the direct-dock option shortens the electrical trace length from the tester to the device which results in better signal bandwidth and fidelity. The big plus for customers is earlier detection of certain defects that might otherwise escape wafer test and only become apparent during final test of the packaged devices.