Articles

MicroProbe Enhances Wafer Probe Card Reliability with CCC Improvement

July 2012
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Wanted: 3D Chip Testing Solutions and Standards

February 2012
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3D Integration: Not a Windfall for Test | Viewpoint by MicroProbe CEO, Dr. Mike Slessor

January 2012
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Chip Test Equipment Maker MicroProbe Doubles Revenue

December 2011
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Final Test Report: Focus on MicroProbe

September 2011
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Wafer Probe & Copper Pillars: Challenges & Solutions
Viewpoint by MicroProbe CEO, Dr. Mike Slessor

August 2011
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Test in Transition: Emerging Test Solutions & Technologies
Presentation by MicroProbe CEO, Dr. Mike Slessor

July 2011
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Three-dimensional Integration Demands Multi-dimensional Test and Inspection Strategies

July 2011
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The semiconductor probe card market grew by 40% in 2010

May 2011
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Wafer Probes: 8 Parameters for Current-carrying Capability in Semiconductor Test

March 2011
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MicroProbe Introduces MEMS-Based Probe Card for Ultra-Fine Pitch Devices

July 2010
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Probe Card Market is Looking Up

May 2010
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Deloitte Names MicroProbe in its 2008 San Diego Technology Fast 50

2008
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